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LRCSLot Review and Comparison System

A comprehensive analysis system most suitable for the IC design industry and testing industry for test data integration.

Leave the dull and time-consuming data integration task to us so that you can maximize your effort on the irreplaceable work of analysis.
Spend time where it is most needed.
  • Data integration is the first task in data analysis and the pain point for many users. Oftentimes, a great amount of effort goes into data collection and integration, leaving little time and resources for analysis.
  • In the semiconductor industry, CP and FT test data is massive, especially Datalog test data. Without a proper analysis platform, it is difficult enough for users to manually compile a whole batch of Datalog data, not to mention analyzing the baseline performance of multiple batches of Datalog at the same time.
  • No doubt an experienced data integration partner can help you a lot!
Excellent engineering database design
  • TYNE, with 20 years of experience in implementing data analysis systems in semiconductor industry, helps companies integrate test data in WAT / CP / FT and other processes, fulfilling every specific analysis need and realize continuous yield improvement.
  • In the data integration phase of the LRCS system, TYNE helps companies integrate the Datalog data format from different testing houses. Users will no longer be bothered with the tedious process of data integration and can enjoy the new momentum of data after integration.
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Spend time where it is most needed.

  • Data integration is the first task in data analysis and the pain point for many users. Oftentimes, a great amount of effort goes into data collection and integration, leaving little time and resources for analysis.
  • In the semiconductor industry, CP and FT test data is massive, especially Datalog test data. Without a proper analysis platform, it is difficult enough for users to manually compile a whole batch of Datalog data, not to mention analyzing the baseline performance of multiple batches of Datalog at the same time.
  • No doubt an experienced data integration partner can help you a lot!

Excellent engineering database design

  • TYNE, with 20 years of experience in implementing data analysis systems in semiconductor industry, helps companies integrate test data in WAT / CP / FT and other processes, fulfilling every specific analysis need and realize continuous yield improvement.
  • In the data integration phase of the LRCS system, TYNE helps companies integrate the Datalog data format from different testing houses. Users will no longer be bothered with the tedious process of data integration and can enjoy the new momentum of data after integration.

Refined analysis templates

  • The LRCS system draws on TYNE’s rich implementation experience in the semiconductor industry, selects common analysis scenarios and refines them into a concise and intuitive menu list. Users can easily select the functions they need; even inexperienced personnel can enjoy key analysis reports with one click.
  • The system automatically connects variouse data sources and conducts cross-shops analysis. It includes a variety of analysis such as WAT / CP / FT correlation analysis, variation analysis, etc., enabling users to quickly identify suspicious factors from numerous test items.

Statistics present in colors

  • The system combines statistical charts with rigorous statistical testing, allowing users to realize diversified analysis with one graph.
  • For abnormal warning conditions that correspond to the analysis theme, specific colors are used on the abnormal chart to highlight the conditions, allowing users to easily digest the results.

Lot-by-lot quick view

  • In order to tackle the pressing need of users checking wafer maps, LRCS provides a complete wafer map library for users to quickly identify specific lots and time periods. With the embedded function lot indexing, users can switch between maps freely with zero waiting time.
  • Whether it is lot-by-lot quick view or wafer-by-wafer detailed review, the system provides users with an experience as smooth as flipping a book.
  • The single-wafer yield out-of-spec warning makes abnormal detection quickly.

In-depth exploration of specific wafers

  • The interactive mode enables exploring delicate changes on wafer maps in depth. Users can thus easily capture chip locations and relevant information, making it easier to communicate abnormals with upstream and downstream manufacturers.
  • The bin code menu interactive mode allows users to switch colors shown on bin codes, or hide bin codes and reduce noises, better highlighting the area impacted by a specific bin code.

All-in-one reporting system

  • The dashboard provides you with a quick view of yield comparison of each lot and step, and automatically alerts you through highlights. Users can instantly focus on abnormal lots and get detailed information of each wafer with one click to follow up.

Interactive report

  • The wafer summary report is connected to the hyperlink of wafer maps, enabling seamless switch between reports and maps.
  • The report includes functions, including sorting, filtering and freezing, to help users explore key information hidden in data.
  • The summary report allows lot indexing so that users can check and select reports as smoothly as flipping a book.

Correlation analysis

  • TYNE’s unique data database design integrates data in different processes in the semiconductor industry such as WAT, CP and FT, making data connection easier.
  • The correlation coefficient report shows reminders in eye-catching colors so that you can rapidly identify key parameters highly correlated with the yield from multiple suspicious parameters. Issues can thus be quickly shared to upstream and downstream manufacturers and the loss caused by abnormalities can be greatly reduced.

Variation analysis

  • Variation analysis is the most common issue in engineering data analysis. When comparing various variations (testing house, machine, test program, probe card, location, parameter, etc.), the system integrates the QC seven tools into graphs and charts, presenting key points where variations occur in the most intuitive and clear manner.
  • In order to objectively determine whether a variation exists, the LRCS system leverages rigorous statistical testing results and presents the results with intuitive statistical charts, allowing users to filter out variables with significant impact through one page report.